The Canadian Mineralogist
XRD and Electron-Microscopy Investigations of Layer Silicates
XRD and Electron-Microscopy Investigations of Layer Silicates
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XRD and Electron-Microscopy Investigations of Layer Silicates – The Canadian Mineralogist Vol. 36, part 6
Editors: R.F. Martin
A demonstration of the power of a combined XRD-TEM approach in the study of layer silicates.
Softcover. 242 pages. 1998.
| ISBN: | 0008-4476 |
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