1 1

Mineralogical Association of Canada

Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot

$40.00 CAD
$40.00 CAD
Early Bird! Sold out
Shipping calculated at checkout.

Topics in Mineral Sciences Volume 41

Editor: M. Fayek

This short course volume introduces SIMS analytical techniques and assesses their applications in the Earth sciences. Topics include light stable and non-traditional isotope analysis, radiogenic isotope analysis quaternary geochronology, and depth profiling techniques.

Softcover. 160 pages. 2009.

ISBN: 978-0-921294-50-4

 
View full details

Other publications:

View all