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The Canadian Mineralogist

XRD and Electron-Microscopy Investigations of Layer Silicates

XRD and Electron-Microscopy Investigations of Layer Silicates

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XRD and Electron-Microscopy Investigations of Layer Silicates – The Canadian Mineralogist Vol. 36, part 6

Editors: R.F. Martin

A demonstration of the power of a combined XRD-TEM approach in the study of layer silicates.

Softcover. 242 pages. 1998.

ISBN: 0008-4476
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