Mineralogical Association of Canada
Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot
Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot
Regular price
$30.00 USD
Regular price
Sale price
$30.00 USD
Unit price
per
Shipping calculated at checkout.
Topics in Mineral Sciences Volume 41
Editor: M. Fayek
This short course volume introduces SIMS analytical techniques and assesses their applications in the Earth sciences. Topics include light stable and non-traditional isotope analysis, radiogenic isotope analysis quaternary geochronology, and depth profiling techniques.
Softcover. 160 pages. 2009.
| ISBN: | 978-0-921294-50-4 |
Couldn't load pickup availability
Other publications:
-
Sold outPegmatites and their Gem Minerals
Regular price $92.00 USDRegular priceUnit price per -
Mineral Identification Manual, Clues From Their Geological Provenance
Regular price $41.00 USDRegular priceUnit price per -
Fleischer's Glossary of Mineral Species 2022
Regular price $33.00 USDRegular priceUnit price per -
Fluid and Melt Inclusions: Applications to Geologic Processes
Regular price $44.00 USDRegular priceUnit price per
