Mineralogical Association of Canada
Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot
Secondary Ion Mass Spectrometry in the Earth Sciences: Gleaning the Big Picture from a Small Spot
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Topics in Mineral Sciences Volume 41
Editor: M. Fayek
This short course volume introduces SIMS analytical techniques and assesses their applications in the Earth sciences. Topics include light stable and non-traditional isotope analysis, radiogenic isotope analysis quaternary geochronology, and depth profiling techniques.
Softcover. 160 pages. 2009.
| ISBN: | 978-0-921294-50-4 |
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